ASSUMPTION UNIVERSITY

FACULTY OF ENGINEERING

COURSE OUTLINE 2/2005

 

Course Title   :   EE 2602 Electronic Devices and Circuits Lab

Instructor       :   A. Tet Toe

Objective        :   After completing this course, student will be able to:

·        Understand the characteristic of p-n junction diode

·        Understand diode clipping and clamping circuits

·        Understand the characteristic of Zener diode

·        Design power supply

·        Understand the input and output V-I characteristic of BJT

·        Analyze and design the BJT amplifier

·        Understand the V-I characteristic of JFET

·        Design the JFET amplifier

Corequisite    :   EE 2601  Electronic Devices and Circuits

 

 


Experiments

 

                                 1.  Laboratory Equipments and Components Familiarization

                                 2.  Semiconductor Junction diode and Characteristics

                                 3.  Clipping and Clamping Circuits

                                 4.  Zener Diode

5.    Bipolar Junction Transistor (BJT) and Characteristics

6.    Biasing of Bipolar Junction Transistor

         

                 Submission of Project Proposal

 

                               ----------------- Midterm Practical Exam ----------------------

                                                              

7.      Analysis of Common Emitter Amplifier

8.      Analysis of Common-Collector Amplifier 

                                 9.   Junction Field Effect Transistor (JFET) and Characteristics

                               10.   JFET Biasing Design and Common Source Amplifier

                               11.   Diode Rectifier Circuits

                               12.   Power Supply Filters

 

                                                            Project Presentation

                                                                         

                               ---------------------Final Practical Exam ------------------------

 

 

 

 

 

 

Evaluation

 

Final grades will be based on the following weight schedule: 

             

Laboratory Performance (30%)

Attendance

5%

Preparation & Interest

10%

Circuit Set-up & Circuit Reading

15%

Laboratory Report (20%)

Presentation

5%

Calculation & Graph

10%

Conclusion

5%

Mid-term Practical Exam (10%)

Circuit Set-up & Circuit Reading                

5%

Calculation & Graph

5%

Final Practical Exam (20%)

Circuit Set-up & Circuit Reading                

10%

Calculation & Graph

10%

Project (20%)

Project Proposal (Before Mid-term Exam )

5%

Project Presentation (Before Final Exam)

10%

Project Report (Before Final Exam)

5%

 

 

 

 

Restrictions

 

1. Each student must complete all of the following experiments during the semester. Otherwise the student will get the grade “W” and has to repeat all experiments during the coming semester.

2. A make-up for the absences will be allowed only on the day of the last make-up shown below. 5% of the lab performance marks and 5%of the lab report marks will be reduced for each make-up. The absentees must forward a proper document for each make-up.

3.  The students who have more than 2 make-ups will get the grade “W”.

4. Lost and damages of the laboratory instruments due to mishandling should be compensated    by the group of    students responsible for it.

5. The calculator allowed in the examination will be only Casio fx-61F and/or Sharp  EL556L and/or Texas Instrument TI-36X and/or Sharp EL506R and/or Sharp EL506V.

6. Practical Laboratory Exam dates are announced by the university course schedule.

                 

Date of the last make-up :    December 26, 2005 (Before Midterm Practical Exam)

                                                Febreuary 24, 2006 (Before Final Practical Exam)